Automatic Measures for Predicting Performance in Off-Line Signature

Alonso-Fernandez, Fernando and Fairhurst, Michael and Fierrez, J. and Ortega-Garcia, J. (2007) Automatic Measures for Predicting Performance in Off-Line Signature. In: IEEE Proceedings: International Conference on Image Processing, 2007 September, San Antonio TX, USA. (The full text of this publication is not available from this repository)

The full text of this publication is not available from this repository. (Contact us about this Publication)
Item Type: Conference or workshop item (Paper)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800 Electronics (see also: telecommunications) > TK7880 Applications of electronics (inc industrial & domestic) > TK7882.B56 Biometrics
T Technology > TA Engineering (General). Civil engineering (General) > TA1637 Image Analysis, Image Processing
Divisions: Faculties > Science Technology and Medical Studies > School of Engineering and Digital Arts > Image and Information Engineering
Depositing User: Yiqing Liang
Date Deposited: 13 Aug 2008 11:26
Last Modified: 24 Apr 2014 14:32
Resource URI: http://kar.kent.ac.uk/id/eprint/6007 (The current URI for this page, for reference purposes)
  • Depositors only (login required):