Sakthivel, Tamil Selvan, Reid, David L., Bhatta, Umananda M., Möbus, Günter, Sayle, Dean C., Seal, Sudipta (2015) Engineering of nanoscale defect patterns in CeO2 nanorods via ex situ and in situ annealing. Nanoscale, 7 (12). pp. 5169-5177. ISSN 2040-3364. E-ISSN 2040-3372. (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:54705)
Item Type: | Article |
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Additional information: | This record has been removed because it is a duplicate record. An alternative record of the same work is available at https://kar.kent.ac.uk/54704/ |
Depositing User: | Dean Sayle |
Date Deposited: | 29 Mar 2016 14:51 UTC |
Last Modified: | 12 Dec 2023 15:18 UTC |
Resource URI: | https://kar.kent.ac.uk/id/eprint/54705 (The current URI for this page, for reference purposes) |