Gao, P, Wang, Chao, Li, Y, LI, FW, Yan, Yong, Hu, Yonghui (2014) 'Defect evaluation using the phase information of an EC-GMR Sensor'. In: Proceedings of IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2014). . p. 25. (doi:10.1109/i2mtc.2014.6860516) (The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided) (KAR id:41707)
| The full text of this publication is not currently available from this repository. You may be able to access a copy if URLs are provided. | |
| Official URL: https://doi.org/10.1109/i2mtc.2014.6860516 |
| Item Type: | Conference or workshop item (Paper) |
|---|---|
| DOI/Identification number: | 10.1109/i2mtc.2014.6860516 |
| Subjects: | T Technology |
| Divisions: | Divisions > Division of Computing, Engineering and Mathematical Sciences > School of Engineering and Digital Arts |
| Depositing User: | Tina Thompson |
| Date Deposited: | 08 Jul 2014 11:27 UTC |
| Last Modified: | 09 Mar 2023 11:33 UTC |
| Resource URI: | https://kar.kent.ac.uk/id/eprint/41707 (The current URI for this page, for reference purposes) |
University of Kent Author Information
Yan, Yong.
| Creator's ORCID: |
 https://orcid.org/0000-0001-7135-5456
|
|---|---|
| CReDIT Contributor Roles: |
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