Wu, S. and Wan, D. and Huang, R. (1995) Function Process and Reliability Analysis of a Two-dependent-unit System. Microelectronics Reliability, 35 (4). pp. 743-747. ISSN 0026-2714.
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In this paper, a two-dependent-unit system is discussed. We assume that the life distribution of the two units is a two-dimensional exponential distribution, and the repair distributions are general distributions, respectively, and the failure unit cannot be repaired “as good as new”. By using a function process, some reliability indices are derived.
|Subjects:||H Social Sciences
H Social Sciences > HA Statistics > HA33 Management Science
|Divisions:||Faculties > Social Sciences > Kent Business School
Faculties > Social Sciences > Kent Business School > Management Science
|Depositing User:||Cathy Norman|
|Date Deposited:||29 Oct 2012 12:29|
|Last Modified:||29 Oct 2012 12:29|
|Resource URI:||http://kar.kent.ac.uk/id/eprint/32008 (The current URI for this page, for reference purposes)|
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