Wu, S. and Wan, D. and Huang, R. (1995) Function Process and Reliability Analysis of a Two-dependent-unit System. Microelectronics Reliability, 35 (4). pp. 743-747. ISSN 0026-2714.
| The full text of this publication is not available from this repository. (Contact us about this Publication) | |
| Official URL http://dx.doi.org/10.1016/0026-2714(95)93183-B |
Abstract
In this paper, a two-dependent-unit system is discussed. We assume that the life distribution of the two units is a two-dimensional exponential distribution, and the repair distributions are general distributions, respectively, and the failure unit cannot be repaired “as good as new”. By using a function process, some reliability indices are derived.
| Item Type: | Article |
|---|---|
| Subjects: | H Social Sciences H Social Sciences > HA Statistics > HA33 Management Science |
| Divisions: | Faculties > Social Sciences > Kent Business School Faculties > Social Sciences > Kent Business School > Management Science |
| Depositing User: | Cathy Norman |
| Date Deposited: | 29 Oct 2012 12:29 |
| Last Modified: | 29 Oct 2012 12:29 |
| Resource URI: | http://kar.kent.ac.uk/id/eprint/32008 (The current URI for this page, for reference purposes) |
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