Extraction of Phase Derivative Data from Interferometer Images using a Continuous Wavelet Transform to Determine Two-Dimensional Refractive Index Profiles

Oven, R. (2010) Extraction of Phase Derivative Data from Interferometer Images using a Continuous Wavelet Transform to Determine Two-Dimensional Refractive Index Profiles. Applied Optics, 49 (22). pp. 4228-4236. ISSN 0740-3224. (The full text of this publication is not available from this repository)

The full text of this publication is not available from this repository. (Contact us about this Publication)
Official URL
http://dx.doi.org/10.1364/AO.49.004228

Abstract

Two-dimensional refractive index profiles of ion exchanged channel waveguides in glass have been obtained from the analysis of interferometer data. To obtain depth data, a shallow bevel is produced in the glass by polishing. The refractive index profile information that is contained within the derivative of the phase data is extracted directly using a continuous wavelet transform algorithm. The algorithm used to characterise and smooth the wavelet ridge is discussed in detail.

Item Type: Article
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK8300 Optoelectronic devices
Divisions: Faculties > Science Technology and Medical Studies > School of Engineering and Digital Arts > Broadband & Wireless Communications
Depositing User: J. Harries
Date Deposited: 27 Jul 2010 14:06
Last Modified: 04 Oct 2012 11:08
Resource URI: http://kar.kent.ac.uk/id/eprint/25156 (The current URI for this page, for reference purposes)
  • Depositors only (login required):