Measurement of Two Dimensional Refractive Index Profiles of Channel Waveguides using an Interferometric Technique

Oven, R. (2009) Measurement of Two Dimensional Refractive Index Profiles of Channel Waveguides using an Interferometric Technique. Applied Optics, 48 (30). pp. 5704-5712. ISSN 1559-128X. (The full text of this publication is not available from this repository)

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Official URL
http://dx.doi.org/10.1364/AO.48.005704

Abstract

Two dimensional refractive index profiles of ion exchanges channel waveguides in glass have been measured using an interferometric method. In order to obtain depth data, a shallow bevel is produced in the glass by polishing. A regularization algorithms for the extraction of the phase data from the interferometer image is presented. The method is applied to waveguides formed by the electric field assisted diffusion of Cu+ ions into a borosilicate glass. The index change obtained from the interferometer is in good agreement with that obtained from measurements on planar waveguides.

Item Type: Article
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK8300 Optoelectronic devices
Divisions: Faculties > Science Technology and Medical Studies > School of Engineering and Digital Arts > Broadband & Wireless Communications
Depositing User: J. Harries
Date Deposited: 10 Nov 2009 11:47
Last Modified: 04 Oct 2012 09:18
Resource URI: http://kar.kent.ac.uk/id/eprint/23274 (The current URI for this page, for reference purposes)
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