Oven, R. (2009) Measurement of Two Dimensional Refractive Index Profiles of Channel Waveguides using an Interferometric Technique. Applied Optics, 48 (30). pp. 5704-5712. ISSN 1559-128X.
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| Official URL http://dx.doi.org/10.1364/AO.48.005704 |
Abstract
Two dimensional refractive index profiles of ion exchanges channel waveguides in glass have been measured using an interferometric method. In order to obtain depth data, a shallow bevel is produced in the glass by polishing. A regularization algorithms for the extraction of the phase data from the interferometer image is presented. The method is applied to waveguides formed by the electric field assisted diffusion of Cu+ ions into a borosilicate glass. The index change obtained from the interferometer is in good agreement with that obtained from measurements on planar waveguides.
| Item Type: | Article |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK8300 Optoelectronic devices |
| Divisions: | Faculties > Science Technology and Medical Studies > School of Engineering and Digital Arts > Broadband & Wireless Communications |
| Depositing User: | J. Harries |
| Date Deposited: | 10 Nov 2009 11:47 |
| Last Modified: | 04 Oct 2012 09:18 |
| Resource URI: | http://kar.kent.ac.uk/id/eprint/23274 (The current URI for this page, for reference purposes) |
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