Quantitative surface microanalysis of samples with extreme topography utilising image interpretation by scatter diagrams and principal component analysis

Barkshire, I.R. and Kenny, P.G. and Fletcher, I.W. and Prutton, M. (1996) Quantitative surface microanalysis of samples with extreme topography utilising image interpretation by scatter diagrams and principal component analysis. Ultramicroscopy, 63 . pp. 193-203. ISSN 0304-3991. (The full text of this publication is not available from this repository)

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Item Type: Article
Subjects: Q Science > QA Mathematics (inc Computing science) > QA 76 Software, computer programming,
Divisions: Faculties > Science Technology and Medical Studies > School of Computing > Applied and Interdisciplinary Informatics Group
Depositing User: Mark Wheadon
Date Deposited: 03 Sep 2009 20:15
Last Modified: 03 Sep 2009 20:15
Resource URI: http://kar.kent.ac.uk/id/eprint/21381 (The current URI for this page, for reference purposes)
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