White-light interferometric spectral analysis for displacement sensing

Podoleanu, Adrian G.H. and Taplin, Stephen R. and Webb, David J. and Jackson, David A. (1994) White-light interferometric spectral analysis for displacement sensing. In: DePaula, Ramon P., ed. Fiber Optic and Laser Sensors XI. Proceedings of the society of photo-optical instrumentation engineers, 2070 . The International Society for Optical Engineering, pp. 92-102. ISBN 0-8194-1335-6. (The full text of this publication is not available from this repository)

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Official URL
http://dx.doi.org/10.1117/12.169894

Abstract

Channeled spectrum of an optical beam generated by a diode laser below threshold after traversing a two-beam interferometer is spectrally analyzed using a grating and a CCD linear array. The paper focuses attention to the Michelson interferometer for displacement sensing. Some particularities and results are presented for the case when the same technique has been applied for determining the widths of parallel sheets of transparent materials or the index of refraction of some liquids. With the present technique, displacement in the range 20 micrometers to 3.5 mm and index of refraction for some liquids were measured with less than 1% error. An analysis of the experimental error sources is made which shows that the ultimate accuracy may be considerably increased.

Item Type: Book section
Additional information: Document Type: Proceedings Paper
Subjects: T Technology > TA Engineering (General). Civil engineering (General) > TA166 Instrumentation
Divisions: Faculties > Science Technology and Medical Studies > School of Physical Sciences > Optics
Faculties > Science Technology and Medical Studies > School of Physical Sciences
Depositing User: O.O. Odanye
Date Deposited: 16 Jun 2009 02:30
Last Modified: 01 Jul 2014 14:13
Resource URI: http://kar.kent.ac.uk/id/eprint/19949 (The current URI for this page, for reference purposes)
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