Podoleanu, A.G.H. and Taplin, S.R. and Webb, D.J. and Jackson, D.A. (1994) White-light interferometric spectral analysis for displacement sensing. In: DePaula, R.P and Mellon Univ, Ctr Excellence Opt Data Proc Univ Connecticut Adv and Technol Cet Precis Mfg, Int Soc Photogrammetry and Remote, Sensing, eds. Fiber Optic and Laser Sensors XI. Proceedings of the society of photo-optical instrumentation engineers, 2070 . The International Society for Optical Engineering, pp. 92-102. ISBN 0-8194-1335-6.
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Channeled spectrum of an optical beam generated by a diode laser below threshold after traversing a two-beam interferometer is spectrally analyzed using a grating and a CCD linear array. The paper focuses attention to the Michelson interferometer for displacement sensing. Some particularities and results are presented for the case when the same technique has been applied for determining the widths of parallel sheets of transparent materials or the index of refraction of some liquids. With the present technique, displacement in the range 20 micrometers to 3.5 mm and index of refraction for some liquids were measured with less than 1% error. An analysis of the experimental error sources is made which shows that the ultimate accuracy may be considerably increased.
|Item Type:||Book section|
|Additional information:||Document Type: Proceedings Paper|
|Subjects:||T Technology > TA Engineering (General). Civil engineering (General) > TA166 Instrumentation|
|Divisions:||Faculties > Science Technology and Medical Studies > School of Physical Sciences > Optics
Faculties > Science Technology and Medical Studies > School of Physical Sciences
|Depositing User:||O.O. Odanye|
|Date Deposited:||16 Jun 2009 02:30|
|Last Modified:||04 May 2012 13:33|
|Resource URI:||http://kar.kent.ac.uk/id/eprint/19949 (The current URI for this page, for reference purposes)|
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