Beam scanning using microstrip line on biased ferrite

Batchelor, J.C. and Langley, R.J. (1997) Beam scanning using microstrip line on biased ferrite. Electronics Letters, 33 (8). pp. 645-646. ISSN 0013-5194. (The full text of this publication is not available from this repository)

The full text of this publication is not available from this repository. (Contact us about this Publication)

Abstract

The beam scanning properties of a 2-element patch array fed by a microstrip reed situated on a ferrite substrate are presented. Biasing the ferrite changes the phase length or the microstrip line, scanning the beam by up to 40 degrees. The resulting scan loss is similar to 2dB, mainly due to the ferrite becoming lossy as it approaches absorption resonance.

Item Type: Article
Depositing User: T. Nasir
Date Deposited: 29 Oct 2009 08:50
Last Modified: 29 Oct 2009 08:50
Resource URI: http://kar.kent.ac.uk/id/eprint/18277 (The current URI for this page, for reference purposes)
  • Depositors only (login required):