Beam scanning using microstrip line on biased ferrite

Batchelor, John C. and Langley, Richard J. (1997) Beam scanning using microstrip line on biased ferrite. Electronics Letters, 33 (8). pp. 645-646. ISSN 0013-5194. (Full text available)

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The beam scanning properties of a 2-element patch array fed by a microstrip reed situated on a ferrite substrate are presented. Biasing the ferrite changes the phase length or the microstrip line, scanning the beam by up to 40 degrees. The resulting scan loss is similar to 2dB, mainly due to the ferrite becoming lossy as it approaches absorption resonance.

Item Type: Article
Depositing User: John Batchelor
Date Deposited: 29 Oct 2009 08:50
Last Modified: 26 May 2014 14:32
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