Use of multiple-wavelength and/or TE/TM effective-refractive-index measurements to reconstruct refractive-index profiles

Oven, R. and Batchelor, S. and Ashworth, D.G. (1997) Use of multiple-wavelength and/or TE/TM effective-refractive-index measurements to reconstruct refractive-index profiles. Iee Proceedings-Optoelectronics, 144 (4). pp. 213-219. ISSN 1350-2433. (The full text of this publication is not available from this repository)

The full text of this publication is not available from this repository. (Contact us about this Publication)
Official URL
http://dx.doi.org/10.1049/ip-opt:19971273

Abstract

A method is presented whereby the refractive-index profile of a planar, surface-dielectric optical waveguide may be reconstructed from sets of effective refractive indices, measured at different wavelengths and/or with sets of effective refractive indices measured with TE and TM polarisation. The index change and the substrate index may be wavelength dispersive and birefringent. The method is compared, both theoretically and experimentally, with conventional single-wavelength method for a number of index profiles. This technique provides more information about the profile than can be obtained from one measured set and is used to analyse the index profiles of potassium ion exchange guides formed in soda-lime glass. The limitations of the technique are also discussed.

Item Type: Article
Uncontrolled keywords: refractive index; optical waveguide
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculties > Science Technology and Medical Studies > School of Engineering and Digital Arts
Depositing User: M.A. Ziai
Date Deposited: 17 Apr 2009 11:20
Last Modified: 17 Apr 2009 11:20
Resource URI: http://kar.kent.ac.uk/id/eprint/18227 (The current URI for this page, for reference purposes)
  • Depositors only (login required):