Silicon-based surface plasmon resonance combined with surface-enhanced Raman scattering for chemical sensing

Nikitin, Petr I. and Beloglazov, A.A. and Valeiko, M.V. and Creighton, Alan and Wright, John D. (1997) Silicon-based surface plasmon resonance combined with surface-enhanced Raman scattering for chemical sensing. Review of Scientific Instruments, 68 (6). pp. 2554-2557. ISSN 0034-6748. (The full text of this publication is not available from this repository)

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Official URL
http://dx.doi.org/10.1063/1.1148160

Abstract

A Si-based surface plasmon resonance (SPR) technique has been successfully applied to NO2 sensing at ppm level, with estimated detectability at less than 100 ppb. Surface-enhanced Raman scattering (SERS) has been used in this scheme as an inherent additional data acquisition channel capable of providing spectroscopic selectivity and amplified sensitivity. The behavior of both the SERS spectrum and the SPR-induced photosignal produced by Au-on-Si grating structures coated with thin 18-crown-6 metal-free phthalocyanine films was simultaneously recorded for exposure of the films to 10 ppm of NO2 in air and its reversal in clean air. Both responses have been found to be reversible. The combination of Si-based SPR and SERS looks promising for thin-film and surface explorations, both in fundamental and sensor applications.

Item Type: Article
Subjects: Q Science
Q Science > QC Physics
Divisions: Faculties > Science Technology and Medical Studies > School of Physical Sciences
Depositing User: M.A. Ziai
Date Deposited: 17 Apr 2009 16:49
Last Modified: 25 Jun 2014 13:59
Resource URI: http://kar.kent.ac.uk/id/eprint/18213 (The current URI for this page, for reference purposes)
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