Rigden, J.S. and Newport, R.J. (1999) Nanoscale heterogeneities in amorphous semiconductor(x)metal(1-x) alloys: A small-angle x-ray scattering study. Journal of Materials Research, 14 (4). pp. 1272-1278. ISSN 0884-2914.
A series of small-angle x-ray scattering (SAXS) experiments has been conducted in order to probe further the X-ray absorption fine structure (EXAFS)-derived nanoscale structure of amorphous hydrogenated silicon(x)tin(1-x), hydrogenated silicon(x)nickell(1-x), and germanium,gold(1-x), materials as a function of metal content. The SAXS results reveal information on cluster formation within these reactively radio-frequency-sputtered amorphous thin films. The data are considered within the context of EXAFS data and lend support to a model in which the degree and nature of the heterogeneities depend primarily on the metal species, with the level of metal content inducing additional effects. In particular, the results support a percolation model for the metal:nonmetal transition in amorphous semiconductor,transition metal(1-x), alloys, the conducting volume elements comprising metal or metal compound-rich regions within the amorphous tetrahedral host network.
|Divisions:||Faculties > Science Technology and Medical Studies > School of Physical Sciences > Functional Materials Group|
|Depositing User:||F.D. Zabet|
|Date Deposited:||15 Apr 2009 16:42|
|Last Modified:||02 Dec 2011 11:50|
|Resource URI:||http://kar.kent.ac.uk/id/eprint/16550 (The current URI for this page, for reference purposes)|
- Depositors only (login required):