Shallow angle x-ray diffraction from in-situ silica:titania sol-gel thin films

Rigden, Jane S. and Newport, Robert J. and Smith, Mark E. and Dirken, P.J. (1995) Shallow angle x-ray diffraction from in-situ silica:titania sol-gel thin films. In: 4th European Powder Diffraction Conference (EPDIC IV), July 1995, Chester, England. (Full text available)

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Abstract

X-ray diffraction at shallow angles of incidence has been used to examine three silica:titania sol-gel thin films. Comparison with transmission x-ray diffraction measurements of similar materials in the bulk shows a distinct increase in disorder in the silica network. An increase in porosity of the network in thin films is also likely, suggested by an increase in Si-O-H bonds. No differences in structure between samples with differing titania contents were observed using this technique.

Item Type: Conference or workshop item (Paper)
Subjects: Q Science
Divisions: Faculties > Science Technology and Medical Studies > School of Physical Sciences > Functional Materials Group
Depositing User: J.M. Smith
Date Deposited: 29 Apr 2009 14:28
Last Modified: 17 Jul 2014 09:27
Resource URI: http://kar.kent.ac.uk/id/eprint/15973 (The current URI for this page, for reference purposes)
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