Rigden, J.S. and Newport, R.J. and Smith, M.E. and Dirken, P.J. (1995) Shallow angle x-ray diffraction from in-situ silica:titania sol-gel thin films. In: 4th European Powder Diffraction Conference (EPDIC IV), July 1995, Chester, England. (Full text available)
X-ray diffraction at shallow angles of incidence has been used to examine three silica:titania sol-gel thin films. Comparison with transmission x-ray diffraction measurements of similar materials in the bulk shows a distinct increase in disorder in the silica network. An increase in porosity of the network in thin films is also likely, suggested by an increase in Si-O-H bonds. No differences in structure between samples with differing titania contents were observed using this technique.
|Item Type:||Conference or workshop item (Paper)|
|Divisions:||Faculties > Science Technology and Medical Studies > School of Physical Sciences > Functional Materials Group|
|Depositing User:||J.M. Smith|
|Date Deposited:||29 Apr 2009 14:28|
|Last Modified:||06 Sep 2011 01:54|
|Resource URI:||http://kar.kent.ac.uk/id/eprint/15973 (The current URI for this page, for reference purposes)|