Rigden, J.S. and Algar, C.D. and Newport, R.J. and North, A.N. and Ibrahim, F. and Wilson, J.I.B. (1995) Small-Angle X-Ray-Scattering Studies Of a-Si-C-H. Journal of Non-Crystalline Solids, 190 (3). pp. 276-282. ISSN 0022-3093.
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| Official URL http://dx.doi.org/10.1016/0022-3093(95)00279-0 |
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Abstract
Small-angle X-ray scattering studies have been performed on a series of four a-Si:C:H alloys, prepared by rf glow discharge decomposition of varying proportions of propane and silane, in an attempt to elucidate their mesoscopic structure. The observed broad scattering peak has been interpreted as originating from irregular, elongated voids with a repeat distance of about 20 Angstrom and correlation length of about 25 Angstrom. The implications of this result in explaining the photo-oxidation properties of the material are also discussed.
| Item Type: | Article |
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| Subjects: | Q Science |
| Divisions: | Faculties > Science Technology and Medical Studies > School of Physical Sciences > Functional Materials Group |
| Depositing User: | J.M. Smith |
| Date Deposited: | 07 May 2009 13:42 |
| Last Modified: | 06 Sep 2011 01:53 |
| Resource URI: | http://kar.kent.ac.uk/id/eprint/15966 (The current URI for this page, for reference purposes) |
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