In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate

Pickup, D.M. and Mountjoy, G. and Roberts, M.A. and Wallidge, G.W. and Newport, R.J. and Smith, M.E. (2000) In situ high temperature x-ray diffraction measurements on a (TiO2)(0.18)(SiO2)(0.82) xerogel using a curved image-plate. Journal of Physics-Condensed Matter, 12 (15). pp. 3521-3529. ISSN 0953-8984. (Full text available)

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http://dx.doi.org/10.1088/0953-8984/12/15/302

Abstract

In situ high temperature x-ray diffraction measurements have been performed on a (TiO2)(0.18) (SiO2)(0.82) xerogel using a 185 mm radius curved image-plate. The results clearly show that the coordination of Ti in this material changes from predominantly sixfold to predominantly fourfold as the temperature is increased from 25 degrees C to 310 degrees C An increase in the average O-O distance associated with this change is also identified. The use of the curved image-plate is shown to be a valuable technique for in situ studies of structural changes associated with thermal treatment of materials.

Item Type: Article
Subjects: Q Science
Divisions: Faculties > Science Technology and Medical Studies > School of Physical Sciences > Functional Materials Group
Depositing User: J.M. Smith
Date Deposited: 08 May 2009 15:50
Last Modified: 02 Dec 2011 11:52
Resource URI: http://kar.kent.ac.uk/id/eprint/15954 (The current URI for this page, for reference purposes)
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